Detailed List of Scientific and Technical Contributions:
Refereed Journals Publications
1.
N. Moriya, R. Kalish and G. Bahir, "Retardation of Implantation Damage
Annealing in InP Due to Local Nonstoichiometry", J. Appl. Phys. 67,
2157, (1990). [PDF]
2.
N. Moriya, Y. Shacham-Diamand and R. Kalish, "Large Increase of
Refractive Index and Compactness in Siloxane-Type Spin-On-Glass Induced by Ion
Implantation", Appl. Phys. Lett. 57, 108,
(1990). [PDF]
3.
N. Moriya, "A New Smoothing Algorithm for Statistical Noise
Reduction", Nucl. Inst. and Methods B53, 208,
(1991). [PDF]
4.
Y. Shacham-Diamand, N. Moriya and G. Bahir, "Electronic Properties of
Metal/Sol-Gel/InP Capacitor", Appl. Phys. Lett. 58,
1314, (1991). [PDF]
5.
W. Pfeiffer, M. Deicher, R. Keller, R. Magerle, E. Recknagle, H. Skudlik, Th.
Wichert, H. Wolf, D. Forkel, N. Moriya and R. Kalish, "Cd-H Pairs in
GaAs: Identification and Stability", Appl. Phys. Lett. 58,
1751, (1991). [PDF]
6.
W. Pfeiffer M. Deicher, R. Keller, R. Magerle, P. Pross, H. Skudlik, Th.
Wichert, H. Wolf, D. Forkel, N. Moriya and R. Kalish, "Characterization
of Cd Implanted and Annealed GaAs and InP by Perturbed Angular Correlation
(PAC) Spectroscopy", Appl. Surf. Sci. 50, 154,
(1991). [PDF]
7.
Y. Shacham-Diamand, E. Finkman, Y. Pinkas and N. Moriya," Study of the
Changes in the Infra-Red Transmission of SiO2 Spin-On-Glass due to
Ion Implantation," Appl. Phys. Lett. 59, 2953
(1991). [PDF]
8.
W. Pfeiffer M. Deicher, R. Kalish, R. Keller, R. Magerle, N. Moriya, P.
Pross, H. Skudlik, Th. Wichert and H. Wolf, "Annealing of Damage in
GaAs and InP After Implantation of Cd and In", Mat. Sci. Forum 83-87,
1481 (1992), ed. G. Davies, G.G. DeLeo and M. Stavola (Trans. Tech.
Publications, Zurich, (1992)). [PDF_abstract]
[PDF_manuscript]
9. A. Katz, A. El-Roy, A. Feingold, M. Geva, N. Moriya, S.J. Pearton, E. Lane, T.
Keel and C.R. Abernathy, "W(Zn) Selectively Deposited and Locally
Diffused Ohomic Contacts to P-InGaAs/In Formed by Rapid Termal Low Pressure
Metalorganic Chemical Vapor Deposition", Appl. Phys. Lett., 62,
2652 (1993). [PDF]
10.
N. Moriya, I. Brener, R. Kalish, W. Pfieffer, M. Deicher, R. Keller, M.
Mggerle, E. Recknagel, H. Skudlik, Th. Wichert, H. Wolf and ISOLDE
Collaboration, "Annealing of Cd-Implanted GaAs: Defect Removal, Lattice
Site Occupation, and Electrical Activation", J. Appl. Phys., 73,
4248 (1993). [PDF]
11.
D.J. Eaglesham, A.E. White, L.C. Feldman, N. Moriya and D.C. Jacobson, "Equilibrium Shape of Si", Phys. Rev. Lett., 70,
1643 (1993). [PDF]
a. Erratum: Phys. Rev. Lett., 72, 2975
(1994) [PDF]
b. Erratum: Phys. Rev. Lett., 72, 1392
(1994) [PDF]
12. N. Moriya, Y. Shacham-Diamand and R. Kalish, "Modification Effects in
Ion Implanted SiO2 Spin-On-Glass", J. Electrochem.
Soc., 140, 1442 (1993). [PDF]
13. A. Katz, A. Feingold, N. Moriya, S. Nakahara, C.R. Abernathy, S.J. Pearton, and
A. El-Roy, "Growth of InP Epitaxial Layers by Rapid Thermal Low Presure
Metalorganic Chemical Vapor Deposition, Using Tertiarybutylphosphine", Appl.
Phys. Lett., 63 2958, (1993). [PDF]
14. A. Katz, A.Feingold, A. El-Roy, N. Moriya, S.J. Pearton, A. Rusby, J. Kovalchick, C.R. Abernathy,
M. Geva and E. Lane, "Rapid Thermal Low Pressure Metalorganic Chemical
Vapor Deposition of Local Diffused W(Zn) Contacts", Semicond. Sci. and
Technol., 8, 1445 (1993). [PDF]
15. N. Moriya, L.C. Feldman, H.S. Luftman and C.A. King, "Electrical and
Structural Characterization of Boron Doped S1-xGex
Strained Layers", J. Vac. Sci. and Technol., B12,
383 (1994). [PDF]
16. A. Katz, A. Feingold, S.J. Pearton, N. Moriya, C.R. Abernathy, F.A. Baiocchi
and M. Geva, "Low Temperature Rapid Thermal Low Pressure Metalorganic
Chemical Vapor Deposition of Zn Doped InP layers using
Tertiarybutylphosphine", Appl. Phys.
Lett., 63, 2546, (1993). [PDF],
17. L. Manchanda, G.R. Weber, Y.O. Kim, L.C Feldman,
N. Moriya, B.E. Weir, R.C. Kistler, M.L. Green and D. Brasen, "A New
Method to Fabricate Thin Oxynitride/Oxide Gate Dielectric for Deep Submicron
Devices", Microelectronic Engineering, Volume 22, Issues 1-4 , Pages
69-72, August 1993. [PDF]
18. A. Katz, A. Feingold, N. Moriya, M. Geva, F.A. Baiocchi, L.C. Luther and E.
Lane, "Rapid Thermal Low Pressure Metalorganic Chemical Vapor
Deposition of In0.53Ga0.47As Films using
Tertiarybutylarsine", Appl. Phys. Lett., 63,
2679, (1993). [PDF]
19. N. Moriya, L.C. Feldman, H.S. Luftman, C.A. King, J. Bevk and B. Freer,
"Boron Diffusion in Strained Si(1-x) Gex Epitaxial
Layers", Phys. Rev. Lett., 71,
883 (1993). [PDF]
20. S.W. Downey, A.B. Emerson, G.E. Georgiou, J. Bevk, R.C. Kistler, N. Moriya,
D.C. Jacobson and M.L. Wise, "Depth Profiling of Dopants in Thin Gate
Oxides in Complementary Metal-Oxide-Semiconductor Structures by Resonance
Ionization Mass Spectrometry", J. Vac. Sci. and Technol. B13,
167 (1995). [PDF]
21.
B. Miller, R. Kalish, L.C. Feldman, A. Katz, N. Moriya, K. Short and A.E.
White, "Patterned Electrical Conductance and Electrode Formation in
Ion-Implanted Diamond Films", J. Electrochem. Soc. 141,
L41, (1994). [PDF]
22.
N. Moriya and L.C. Feldman, "Comment on Diffusion in Strained Si(Ge)",
Private communication, AT&T Bell Labs, BL01127-940617-12TM. [PDF]
23.
M. Passlack, E.F. Schubert, W.S. Hobson, M. Hong, N. Moriya, S.N.G. Chu, K. Konstadinidis, J.P.
Mannaerts, M.L. Schnoes and G.J. Zydzik, "Ga2O3
Films for Electronic and Optoelectronic Applications", J. Appl. Phys. 77,
686 (1995). [PDF]
24.
M. Passlack, M. Hong, E.F. Schubert, J.R. Kwo, J.P. Mannaerts, S.N.G. Chu, N. Moriya, and F.A.
Thiel, "In-Situ Fabricated Ga2O3-GaAs Structures
with low Interface Recombination Velosity", Appl. Phys. Lett., 66,
625, (1995). [PDF]
25.
M. Hong, M. Passlack, J.P. Mannaerts, J. Kwo, S.N.G. Chu, N. Moriya, S.Y. Hou and V. J. Fratello,
"Low Interface State Density Oxide-GaAs Structures Fabricated by
In-Situ Molecular Beam Epitaxy", J. Vac. Sci. and Technol., B14,
2297 (1996). [PDF]
26. N. Moriya, L.C. Feldman, S.W. Downey, C.A. King and A.B. Emerson, "Interfacial
Segregation in Strained Heterostructures: Boron in Si0.8Ge0.2/Si",
Phys. Rev. Lett., 75, 1981 (1995). [PDF].
27.
M.L. Wise, N. Moriya and S.W. Downey, "Factors Affecting the Quantification of Boron in
SiO2 ans Si by Spattered Neutral Mass-Spectrometry", Surf.
Inter. Anal. 24, 371, (1996). [PDF]
28.
M. Passlack, M. Hong, J.P. Mannaerts, R.L. Opila, S.N.G. Chu, N. Moriya, F. Ren and J.R. Kwo,
"Low Dit Thermodynamically Stable Ga2O3-GaAs
Interfaces: Fabrication, Characterization and Modeling", IEEE Trans.
Elect. Dev. 44 214, (1997). [PDF]
29.
C. Saguy, C. Cytermann, B. Fizgeer, V. Richter, Y.
Avigal, N. Moriya, R. Kalish, B. Mathieu, A. Deneuville, "Diffusion of
hydrogen in undoped, p-type and n-type doped diamonds", Diamond and Related
Materials 12, 623, (2003). [PDF]
30.
N. Moriya, "On high-order discrete derivatives of stochastic variables", Applied
Mathematical Modelling, 30(9), 816, (2006). [PDF]
31.
N. Moriya, "Noise-level determination for discrete spectra with Gaussian or Lorentzian probability density functions", Nuclear
Instruments and Methods in Physics Research, A 618(1-3), 306, (2010).[PDF]
32.
D. A. Hunter, C. Melton, S. Leshin, A. Wong, M. Clark, J. Kamienski, N. Moriya,
B. Packwood, B. Birket, W. Edwards, M. Millward, and I. Wheelband, "Wide-field Imaging of the Environments of LITTLE THINGS Dwarf Irregular Galaxies",
The Astrophysical Journal, A 852, 114, (2018).[PDF]
Refereed Conference Proceedings
Publications
33.
N. Moriya, R. Kalish, R. Brenner and V. Richter, "Effecs of Si
Implantation in Sb-Silica Spin-On Layers", Mat. Res. Soc. Symp. Proc.,
Vol. 105, 97, (1988). [PDF]
34.
Y. Shacham-Diamand, N. Moriya and R. Kalish, "Ion-Implantation Effects
on Spin-On-Glass (Sol-Gel) SiO2 Films", Mat. Res. Soc.
Symp. Proc., Vol. 180, 703, (1990). [PDF]
35.
W. Pfeiffer M. Deicher, R. Keller, R. Magerle, P. Pross, H. Skudlik, Th.
Wichert, H. Wolf, D. Forkel, N. Moriya and R. Kalish," Characterization
of Cd Implanted and Annealed GaAs and InP by Perturbed Angular Correlation
(PAC) Spectroscopy", E-Mat. Res. Soc. Symp. Proc., Strasburg, (1990).
[PDF]
36.
W. Pfeiffer M. Deicher, R. Kalish, R. Keller, R. Magerle, N. Moriya, P.
Pross, H. Skudlik, Th. Wichert and H. Wolf , "Annealing of Damage in
GaAs and InP After Implantation of Cd and In", Mater. Sci. Forum 83-87
(1992), Proc. Int. Conf. Defects Semicond., 16th, 1991, Pt. 3, 1481-6. CODEN: MSFOEP ISSN:0255-5476. [PDF]
37. N. Moriya, M. Manfred, R. Kalish, R. Keller, R. Magerle, W. Pfeiffer P. Poss,
H. Skudlik, Th. Wichert and H. Wolf," Passivating Complexes in Cd
Doped GaAs and InP: Microscopic Properties and Electrical Effects" ,
Mat. Res. Soc. Symp. Proc. Vol. 262, 431, (1992). [PDF]
38. N. Moriya, C.A. King, L.C. Feldman, H.S. Luftman, M.L. Green, J. Bevk and B.E.
Weir, "Boron Diffusion in Si(1-x) Gex Strained
Layers", Mat. Res. Soc. Symp. Proc., Vol. 281,
427, (1993). [PDF]
39. A. Katz, A. El-Roy, A. Feingold, T. Keel, M. Geva, N. Moriya, S.J. Pearton, E.
Lane and C.R. Abernathy, "RT-LPMOCVD of W-Based Self-Aligned Diffusion
Contacts to InP and Related Materials", in press the MRS conference in
Boston December (1992).
40. Katz., A. Feingold, S.J. Pearton, E. Lane, N. Moriya and M. Geva, "W-Based
RTLPCVD Ohmic Contacts to InP Formed by and Integrated Process",
Electrochemical Society Meeting, Toronto, July 1, 1992 (SOTAPOCS XVII).
41. N. Moriya, L.C. Feldman, H.S. Luftman and C.A. King, "Electrical and
Structural Characterization of Boron Doped S1-xGex Strained Layers",
The Second International Workshop on the Measurement and Characterization of
Ultra-Shallow Doping Profiles in Semiconductors, Proc. Vol. II, 359, (1993). [PDF]
42. A. Katz, A. Feingold, A. El-Roy, N. Moriya, S.J. Pearton, A. Rusby, J.
Kovalchick, C.R. Abernathy, M. Geva and E. Lane, "Another Step in
Developing a Single Wafer Integrated Process: Rapid Thermal Low Presure
Metalorganic Chemical Vapor Deposition of Local Diffused W(Zn) Contacts",
Mat. Res. Soc. Symp. Proc., Vol. 282, (Chemical Perspectives of
Microelectronic Materials III), 217, (1993). [PDF]
43. L.
Manchanda, G.R. Weber, Y.O. Kim, L.C Feldman, N. Moriya, B.E. Weir, R.C.
Kistler, M.L. Green and D. Brasen, "A New Method to Fabricate Thin
Oxynitride/Oxide Gate Dielectric for Deep Submicron Devices",
Insulating Films on Semiconductors Conf., The Netherlands 6/2-5, 1993. . [PDF]
44. L. Manchanda, G.R. Weber, W. Mansfield, D.M.
Boulin, K. Krisch, Y.O. Kim, R. Storz, N. Moriya, H.S. Luftman, L.C
Feldman, M.L. Green, R.C. Kistler, J.T.C. Lee and F. Klemens, "A
Boron-Retarding and High Interface Quality Thin Gate Dielectric for
Deep-Submicron CMOS Devices", Electron Devices Meeting, 1993.
Technical Digest., International, 5-8 Dec 1993, on page(s): 459-462 1993.
45. D. Brasen, L.C. Feldman, M.L. Green, K. Krisch, W. Lennard, W.-C. Liang, L.
Manchanda, N. Moriya, H. Nussbaumer, H. Tang, G. Weber and B.E. Weir, "Determination
of Nitrogen in N2O-Grown Oxynitride Films by a Nuclear Reaction
Technique", 24th Semiconductors
Interface Specialists Conf., Bonaventure Resort & Spa, Ft. Lauderdale, FL,
12/8-11, 1993.
46. M. Passlack, M. Hong, E.F. Schubert, J.P. Mannaerts, W.S. Hobson, N. Moriya, J. Lopata and G.J.
Zydzik "Ga2O3 Films for Electronic
and Optoelectronic Applications", presented at the 21st International
Symposium on Compound Semiconductors, (1994).
47. J. Bevk, M, Furtsch, H.-J. Gossmann, N. Moriya, L.C. Feldman, R.-H. Yan, Y. Kim
and H.S. Luftman, "Suppression of Oxidation Enhanced Diffusion in Si via
Germanium Incorporation", presented at the Material Research Society
Spring meeting, Pittsburg, 1995.
48. J. Bevk, M, Furtsch, N. Moriya, L.C. Feldman, G.E. Georgiou, K.S. Krisch, R.C.
Kistler, D.M. Boulin and L. Manchanda, "Study of Poly Depletion Effect in
MOS Structures with Boron-Doped Polysilicon Gate Electrodes",
presented at the Material Research Society Spring meeting, Pittsburg, 1995.
49. M. Furtsch, J. Bevk, J.D. Bude, S.W. Downey, K.S. Krisch, N. Moriya, P.
Silverman and, H. Luftman, "Comparative Study of Experimental Techniques
for Boron Profiling at Poly-Si/SiO2 Interface", presented at
the Material Research Society Spring meeting, Pittsburg, 1995, Mater. Res. Soc.
Symp. Proc. (1995), 378 (Defect and Impurity Engineered
Semiconductors and Devices), 857-62.
50. M. Passlack, M. Hong, E.F. Schubert, J.P. Mannaerts, W.S. Hobson, N. Moriya, J. Lopata and G.J.
Zydzik "Ga2O3 Films for Insulator/III-V
Semiconductor Interfaces", Proceedings of the Symposium on Compound
Semiconductors, Iss 141, pp. 597 (1995).
51. M. Passlack, M. Hong, J.P. Mannaerts, S.N.G. Chu, R.L. Opila,
N. Moriya, "In-situ Ga2O3 process for GaAs
inversion/accumulation device and surface passivation applications." Tech.
Dig. - Int. Electron Devices Meeting, Proceedings of IEDM IEEE, New York (1995), 383-386. [PDF]
52. A. Plotkin, E. Paperno and N. Moriya, "Relationship Between the Measurement and Motion
Bandwidths in Magnetic Tracking", Proceedings of the IEEE Conference IMTC/2006, Sorrento, Italia, 24 - 27 April on the
Instrumentation and Measurement Technology, pp. 2165-2170, [PDF]
53.
N. Moriya, "Non-Stationary Noise Estimation in Adaptive Linear and Extended
Kalman Filtering", Proceedings of the 2nd IC-EpsMsO Conference 2007, Athens, Greece, 4 - 7 July on the Experiments/Process/System
Modeling/Simulation & Optimization (#Conference_jul07), no. 65, [PDF]
Books:
A.
Book (Scientific)
54. N. Moriya, "Primer to Kalman Filtering: A Physicist Perspective",
Nova Science Publishers, Inc., ISBN: 978-1-61668-311-5, 2011.
B.
Chapter in Book
55. N. Moriya, "Noise-Related
Multivariate Optimal Joint-Analysis in Longitudinal Stochastic Processes",
pp. 223-260, Chapter 6 in Progress in Applied Mathematical Modeling, ed.
Fengshan Yang, Nova Science Publishers, Inc., ISBN: 978-1-60021-976-4, 2008.
C.
Book (Literature)
56.
N. Moriya, "Illusive Ties", Astrolog Publishing, 2007,
(Hebrew),
Private Communications
1. N.
Moriya, L.C. Feldman, C.A. King and H.S. Luftman, "Hole Mobility and
Solid Solubility of Boron Doped Si(1-x) Gex Strained
Layers", Private Communication AT&T Bell Laboratories (1993),
2. N. Moriya and L.C. Feldman, "Comment on Diffusion in Strained
Si(Ge)", Private Communication BL011127-940617-12TM AT&T Bell
Laboratories (1994),
3. N.
Moriya and Boaz Spivak, "Irregular Magnetic Field Topology Around Mutually
Orthogonal, Separated Current Loops", Private Communication NTM-0243 Netmor
Ltd. - Applied Modeling Research, Ramat-Hasharon, 47113, Israel (1999),
4. N. Moriya, "A Comment on a 15'th Way and Fundamental Look at a Correlation
Coefficient: Optimization-Oriented", Private Communication siOnet Ltd. -
Applied Modeling Research, Herzelia, 46445, Israel (2006),
Talks and Presentations at
conferences:
1. 12-03-1987: Material Research Society Fall
meeting, Boston, MA, "Effecs of Si Implantation in Sb-Silica Spin-On
Layers".
2. 12-01-1992: Material Research Society Fall
meeting, Boston, MA, "Boron Diffusion in Si(1-x) Gex
Strained Layers".
3. 02-17-1993: AT&T Bell Laboratories Dept. 11127, Murray Hill NJ, "On Dopant diffusion in Strained Layers".
4. 03-23-1993: The Second International Workshop
on the Measurement and Characterization of Ultra-Shallow Doping Profiles in
Semiconductors, Research Triangle Park, NC, "Electrical and Structural
Characterization of Boron Doped S1-xGex Strained Layers".
5. 12-02-1994: Material Research Society Fall
meeting, Boston, MA, "Diffusion Effects in Si1-xGex
Strained Layers".
6. 12-02-2005: SIAM conference on, Computational
Science and Engineering, Orlando, FL, "Noise Level Estimation in
Stochastic Processes". Chair of session "Signal and Image
Processing",
7. 04-07-2007: 2nd IC-EpsMsO Conference 2007, Athens, Greece, 4-7 July on the Experiments/Process/System
Modeling/Simulation & Optimization, "Non-Stationary Noise
Estimation in Adaptive Linear and Extended Kalman Filtering". Chair
of session "Kalman Filtering and SAR".
Invited Talks
1.
"On Dopant Diffusion in Strained Layers", Colloquium, Technion, Israel, May 1993,
2.
"Boron Diffusion in Strained Si1-xGex Epitaxial
Layers", at the American Physical Society meeting, (R4),
21-25 March 1994 in Pittsburg, PA,
3.
"Boron Diffusion in Strained Si1-xGex Epitaxial
Layers" at the Gordon Conference: Point & Line Defects in
Semiconductors, Plymuth NH - 31 July 5 August 1994, [PDF].
List of Patents:
Granted:
1.
W.C. Dauteremont-Smith, L.C. Feldman, R. Kalish, A. Katz,
B. Miller and N. Moriya, "Metallized
Paths on Diamond Surfaces", European Patent No. 92311255-1 [16Feb93],
USA 5,334,306 [02Aug94],
2.
N. Moriya,
I. Brener and L.C. Feldman, "Reverse side etching for producing layers
with strain variation", USA 5,532,510 [02Jun96],
3.
Itzkovich Moti and N. Moriya,
"Method for Determining the Position of Targets in Three Dimensional Space
by Optical Chirped RF Modulation", USA 5,982,480 [11Nov99],
4.
N. Moriya and Itzkovich Moti, "Ultrasonic
Positioning and Tracking System", USA 6,141,293 [31Dec00],
5.
N. Moriya, Itzkovich Moti and Boaz Spivak, "System for Three
Dimensional Positioning and Tracking", IL 126284 [02mar03]; USA 6,316,934 [13Nov01],
6.
N. Moriya, "Method and Apparatus for Determining the Relative Height
of Two Targets", IL 125142 [3Jul01]; USA 6,414,745 [02Jul02],
7.
N. Moriya, Itzkovich Moti, and Yehuda Albek, "Localization
and Tracking System", Israel app. No: 127868
[30dec98]; USA 6,484,131 [19Nov02],
8.
N. Moriya, "System for
Three Dimensional Positioning and Tracking with Dynamic Range Extension", USA 6,487,516 [26Nov02],
9.
N. Moriya, Primak Harel and Moti Itzkovich, "System for Three Dimensional Positioning and
Tracking", USA 6,691,074 [10Feb04],
10. Noam Tzioni, Itzkovich Moti and N. Moriya, "Electrical Circuit for Cross-Talk Reduction", USA 6,711,215
[23Mar04],
11. N. Moriya, Itzkovich Moti, and Yehuda Albek, "Digital
Coherent Envelope Demodulation of FDMA Signals", IL
132161 [15Dec02]; USA 6,735,263
[11May04],
12. N. Moriya, Gidron David and Harel Primak, "Input Device for Personal Digital Assistants", USA 6,727,891 [27Apr04],
13. N. Moriya, Harel Primak and Itzkovich Moti, "System
for Three Dimensional Positioning and Tracking", USA 6,912,475 [28Jun05],
14. Harel Primak and N. Moriya, "Digital
Phase Locked Loop", USA 6,931,082
[16Aug05],
15. N. Moriya, "System and Method for Statistically Separating and Characterizing
Noise which is added to a Signal of a Machine or a System, USA 7,552,154
[23Jun09],
16. N. Moriya, "System and Method for Statistically Separating and Characterizing
Noise which is added to a Signal of a Machine or a System, USA 8,285,764
[09Oct12],
17. M. Margalit, D. Hirshberg and N. Moriya, "Hardware Interconnect Based Communication Between Solid State Drive Controllers, PCT/US2013/073949
[18Jun15],
Music Composition:
1. Variations on Canon in D (Pachelbel) - 2004, (midi or MP3)
